Author: Neuhaus, M.
Paper Title Page
WEP003 Balanced Optical-Microwave Phase Detector for 800-nm Pulsed Lasers with Sub-Femtosecond Resolution 322
  • K. Şafak, A. Berlin, E. Cano Vargas, H.P.H. Cheng, A. Dai, J. Derksen, M. Neuhaus, P. Schiepel
    Cycle GmbH, Hamburg, Germany
  • F.X. Kärtner
    Deutsches Elektronen Synchrotron (DESY) and Center for Free Electron Science (CFEL), Hamburg, Germany
  Novel light-matter interaction experiments conducted in free-electron lasers, ultrafast electron diffraction instruments and extreme light infrastructures require synchronous operation of microwave sources with femtosecond pulsed lasers [1]. In particular, Ti:sapphire lasers have become the most common near-infrared light source used in these facilities due to their wide-range tunability and their ability to generate ultrashort pulses at around 800-nm optical wavelength [2]. Therefore, a highly sensitive optical-to-microwave phase detector operating at 800 nm is an indispensable tool to synchronize these ubiquitous lasers to the microwave clocks of these facilities. Electro-optic sampling is one approach that has proven to be the most precise in extracting the relative phase noise between microwaves and optical pulse trains. However, their implementation at 800-nm wavelength has been so far limited [3]. Here, we show a balanced optical-microwave phase detector designed for 800-nm operation based on electro-optic sampling. The detector has a timing resolution of 0.01 fs RMS for offset frequencies above 100 Hz and a total noise floor of less than 10 fs RMS integrated from 1 Hz to 1 MHz.
[1] M. Xin, K. Shafak and F. X. Kärtner, Optica, vol. 5, no. 12, pp. 1564-1578, 2018.
[2] H. Yang et al., Scientific Reports, vol. 7, no. 39966, 2017.
[3] M. Titberidze, DESY-THESIS-2017-040, 2017.
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About • paper received ※ 20 August 2019       paper accepted ※ 27 August 2019       issue date ※ 05 November 2019  
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