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TY - CONF AU - Orlandi, G.L. AU - Borrelli, S. AU - Cefarin, N. AU - Dal Zilio, S. AU - David, Ch. AU - Ferianis, M. AU - Ferrari, E. AU - Guzenko, V. AU - Hermann, B. AU - Huerzeler, O. AU - Ischebeck, R. AU - Lazzarino, M. AU - Lombosi, C. AU - Ozkan Loch, C. AU - Penco, G. AU - Prat, E. AU - Veronese, M. ED - Schaa, Volker R.W. ED - Decking, Winfried ED - Sinn, Harald ED - Geloni, Gianluca ED - Schreiber, Siegfried ED - Marx, Michaela TI - Wire-Scanners with Sub-Micrometer Resolution: Developments and Measurements J2 - Proc. of FEL2019, Hamburg, Germany, 26-30 August 2019 CY - Hamburg, Germany T2 - Free Electron Laser Conference T3 - 39 LA - english AB - Monitors of the beam transverse profile with ever more demanding spatial resolution and minimal invasivity are required by the FEL community. In order to improve the spatial resolution towards the sub-micrometer limit as well as to decrease the impact on the lasing process, nano-fabricated wire-scanners have been manufactured independently at PSI and FERMI by means of a lithographic technique [1,2]. Experimental tests carried out at SwissFEL at a low emittance demonstrated the capability of such innovative wire-scanner solutions to resolve beam transverse profiles with a size of 400-500 nm without being affected by any resolution limit. Status and outlook of nano-fabricated wire-scanners will be presented. PB - JACoW Publishing CP - Geneva, Switzerland SP - 307 EP - 310 KW - FEL KW - experiment KW - electron KW - operation KW - emittance DA - 2019/11 PY - 2019 SN - 978-3-95450-210-3 DO - doi:10.18429/JACoW-FEL2019-WEB02 UR - http://jacow.org/fel2019/papers/web02.pdf ER -